Olaf C. Haenssler received an Dipl-Ing degree in electrical engineering from University of Applied Sciences Emden, a Dr-Ing in computer science from University of Oldenburg (UOL) and a PhD in nanoelectronics and microwaves from Université de Lille (France) at Institut d'électronique de microélectronique et de nanotechnologie (CNRS-IEMN).
After working some years in industry and academia, he is currently senior researcher at UOL, where he is also head of the research laboratory at the Division of Microrobotics and Control Engineering. Olaf has been a Visiting Scientist at National Institute of Standards and Technology (Boulder/US), University of Waterloo (CA), Technical University of Denmark among others.
His research interests focus on the synergy of microwave engineering and nanorobotics, in conjunction with various scanning microscopy methods.
Furthermore, he is a reviewer for various publications, such as Applied Physics Letters, IEEE Transactions on Microwave Theory and Techniques, IEEE Microwave Magazine, IEEE Transactions on Instrumentation and Measurement, Elsevier Mechanical Systems and Signal Processing, Elsevier Materials Today Communications, and several national science funds. Olaf is an elected Senior Member of IEEE MTT-S and RAS.
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