Olaf C. Haenssler received an Dipl-Ing degree in electrical engineering from University of Applied Sciences Emden, a PhD in Nanoelectronics and Microwaves from Université de Lille (FR) at Institut d' Électronique de Microélectronique et de Nanotechnologie (CNRS-IEMN) and his Dr-Ing in Computer Science with honors from University of Oldenburg (DE).
After working some years in research industry and academia, including participations in subantarctic research expeditions, he is currently head of the research laboratory at the Division of Microrobotics and Control Engineering as a senior scientist. Olaf has been a Visiting Scientist at National Institute of Standards and Technology (Boulder/US), University of Waterloo (CA), Technical University of Denmark among others. His research interests focus on the synergy of microwave engineering and nanorobotics, in conjunction with scanning microscopy methods.
Furthermore, he is a reviewer for various publications, such as Applied Physics Letters, IEEE Transactions on Microwave Theory and Techniques, IEEE Microwave Magazine, IEEE Transactions on Instrumentation and Measurement, IEEE Robotics and Automation Letters, Elsevier Mechanical Systems and Signal Processing, Elsevier Materials Today Communications, Nature Scientific Reports and several national science funds. Olaf is an elected Senior Member of IEEE MTT-S and RAS.
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