PD Dr. Svend-Age Biehs
Institute of Physics (» Postal address)
Modelling of Near-Field Thermal Microscopes
With so-called near-field thermal imaging microscopes, such as the near-field scanning thermal microscope developed in Oldenburg (see Prof. Achim Kittel's group), heat currents in the near-field regime (i.e. distance smaller than the thermal wavelength) can be measured with nanometer resolution. Other microscopes based on scattering, such as the scattering noise microscope shown schematically in the image on the left (see Prof. Zhenghua An's group), scatter the thermal near field to a far-field detector. This enables non-contact measurement of local temperatures and local density of states with nanoscale resolution. We collaborate with experimental research groups to model and interpret the signals measured with such microscopes.
Selected Publications:
- Svend-Age Biehs, Achim Kittel, and Zhenghua An:
Local density of states above a disk - Geometrical vs. thermal boundary conditions,
J. Appl. Phys. 134, 043102(2023).
- Florian Herz and Svend-Age Biehs:
Thermal radiation and near-field thermal imaging of a plasmonic Su–Schrieffer–Heeger chain,
Appl. Phys. Lett. 121, 181701(2022).
- Florian Herz, Zhenghua An, Susumu Komiyama,, Svend-Age Biehs:
Revisiting the Dipole Model for a Thermal Infrared Near-Field Spectroscope,
Phys. Rev. Applied 10, 044051 (2018).
- Qianchun Weng, Susumu Komiyama, Le Yang, Zhenghua An, Pingping Chen, Svend-Age Biehs, Yusuke Kajihara, Wei Lu:
Imaging of nonlocal hot-electron energy dissipation via shot noise,
Science 360, 775 (2018).
- Konstantin Kloppstech, Nils Könne, Svend-Age Biehs, Alejandro W. Rodriguez, Ludwig Worbes, David Hellmann and Achim Kittel:
Giant heat transfer in the crossover regime between conduction and radiation,
Nature Comm. 8, 14475 (2017).
- Achim Kittel , Uli Wischnath , Joachim Welker , Oliver Huth , Felix Rüting, and Svend-Age Biehs:
Near-field thermal imaging of nano-structured surfaces,
Appl. Phys. Lett. 93, 193109 (2008).
- Achim Kittel, Wolfgang Müller-Hirsch, Jürgen Parisi, Svend-Age Biehs, Daniel Reddig, and Martin Holthaus:
Near-Field Heat Transfer in a Scanning Thermal Microscope,
Phys. Rev. Lett. 95, 224301 (2005).