Analytic Methods and Tools

DEVice characterization

• Current-voltage measurements under standard-test conditions (STC-IV)

• External & internal quantum efficiency (EQE & IQE) - also temperature dependent

• Capacitance-voltage profiling (CV)

• Temperature- and illumination-dependent current-voltage measurements (IVT)

• Light-beam induced current scanning (OBIC bzw. LBIC) 

• Electron-beam induced current scanning (EBIC) - lateral and cross-sectional

• Monitoring of metastable device performance (light soaking, annealing)

Optical film properties

• Classical UV-Vis-NIR-spectroscopy

• Spectroscopic ellipsometry (VASE)

• Photoluminescence spectroscopy (PL)

Structural properties

• X-ray diffraction (XRD) with Euler cradle

• Raman spectroscopy

• Atomic force (AFM) and UHV Kelvin-probe force microscopy  (KPFM) - KPFM is currently not implemented

electronic film properties

• Thermal admittance spectroscopy (TAS)

• Deep-level transient spectroscopy  (DLTS)

• Time-resolved and spatially resolved photoluminescence (TR-PL, µ-PL)

• Temperature dependent (photo-)conductivity (TC, TPC)

• Low-temperature photoluminescence with variable excitation wavelength (T-PL)

macroscopic imaging techniques

• Lock-in thermography (D-LIT/I-LIT)

• Photoluminescence mapping (PL(x)) (available 06/2014)

• Elektroluminescence-Mapping (EL(x)) (available 06/2014)

Materials, devices & processing

• Cluster-deposition facility for fabrication of chalkogenide thin film solar cells (Von Ardenne GmbH)

• Furnace for classical and plasma-assisted selenization of metallic precursors (Von Ardenne GmbH)

• Tube furnace for selenization and post-sulfurization

• Chemical bath deposition (CBD)

• Colloidal synthesis of kesterite nanoparticle inks for non-vacuum deposition