Analytical Methods and Equipment
Methods & Equipment
Analytic Methods and Tools
DEVice characterization
- Current-voltage measurements under standard-test conditions (STC-IV)
- External & internal quantum efficiency (EQE & IQE) - also temperature dependent
- Capacitance-voltage profiling (CV)
- Temperature- and illumination-dependent current-voltage measurements (IVT)
- Light-beam induced current scanning (OBIC bzw. LBIC)
- Electron-beam induced current scanning (EBIC) - lateral and cross-sectional
- Monitoring of metastable device performance (light soaking, annealing)
Optical film properties
- Classical UV-Vis-NIR-spectroscopy
- Spectroscopic ellipsometry (VASE)
- Photoluminescence spectroscopy (PL)
Structural properties
- X-ray diffraction (XRD) with Euler cradle
- Raman spectroscopy
- Atomic force (AFM) and UHV Kelvin-probe force microscopy (KPFM) - KPFM is currently not implemented
electronic film properties
- Thermal admittance spectroscopy (TAS)
- Deep-level transient spectroscopy (DLTS)
- Time-resolved and spatially resolved photoluminescence (TR-PL, µ-PL)
- Temperature dependent (photo-)conductivity (TC, TPC)
- Low-temperature photoluminescence with variable excitation wavelength (T-PL)
macroscopic imaging techniques
- Lock-in thermography (D-LIT/I-LIT)
- Photoluminescence mapping (PL(x)) (available 06/2014)
- Elektroluminescence-Mapping (EL(x)) (available 06/2014)
Materials, devices & processing
- Cluster-deposition facility for fabrication of chalkogenide thin film solar cells (Von Ardenne GmbH)
- Furnace for classical and plasma-assisted selenization of metallic precursors (Von Ardenne GmbH)
- Tube furnace for selenization and post-sulfurization
- Chemical bath deposition (CBD)
- Colloidal synthesis of kesterite nanoparticle inks for non-vacuum deposition