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Methods & Equipment

Analytic Methods and Tools

DEVice characterization

 

  • Current-voltage measurements under standard-test conditions (STC-IV)
  • External & internal quantum efficiency (EQE & IQE) - also temperature dependent
  • Capacitance-voltage profiling (CV)
  • Temperature- and illumination-dependent current-voltage measurements (IVT)
  • Light-beam induced current scanning (OBIC bzw. LBIC) 
  • Electron-beam induced current scanning (EBIC) - lateral and cross-sectional
  • Monitoring of metastable device performance (light soaking, annealing)

 

Optical film properties

 

  • Classical UV-Vis-NIR-spectroscopy
  • Spectroscopic ellipsometry (VASE)
  • Photoluminescence spectroscopy (PL)

 

Structural properties

 

  • X-ray diffraction (XRD) with Euler cradle
  • Raman spectroscopy
  • Atomic force (AFM) and UHV Kelvin-probe force microscopy  (KPFM) - KPFM is currently not implemented

 

electronic film properties

 

  • Thermal admittance spectroscopy (TAS)
  • Deep-level transient spectroscopy  (DLTS)
  • Time-resolved and spatially resolved photoluminescence (TR-PL, µ-PL)
  • Temperature dependent (photo-)conductivity (TC, TPC)
  • Low-temperature photoluminescence with variable excitation wavelength (T-PL)

 

macroscopic imaging techniques

 

  • Lock-in thermography (D-LIT/I-LIT)
  • Photoluminescence mapping (PL(x)) (available 06/2014)
  • Elektroluminescence-Mapping (EL(x)) (available 06/2014)

 

Materials, devices & processing

 

  • Cluster-deposition facility for fabrication of chalkogenide thin film solar cells (Von Ardenne GmbH)
  • Furnace for classical and plasma-assisted selenization of metallic precursors (Von Ardenne GmbH)
  • Tube furnace for selenization and post-sulfurization
  • Chemical bath deposition (CBD)
  • Colloidal synthesis of kesterite nanoparticle inks for non-vacuum deposition

 

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