Electronic Speckle Pattern Interferometry (ESPI)
Electronic speckle pattern interferometry (ESPI)
- 3D ESPI system with spatial phase shifting technology (SPS)
- 3D ESPI system with temporal phase shifting technique (TPS)
- Microscope ESPI on measuring fields in the order of (10³-10⁶) µm²
- Short coherence ESPI using light sources with coherence lengths
in the range of a few 10 µm - Temporal demodulation of phase distributions
- Active in-line phase stabilisation in ESPI systems
- Measurement of surface deformations
- Measurement of surface decorrelations
- Vibration analyses(application example)
