The Institute of Chemistry runs a modern X-Ray Photoelectron Spectrometer (XPS Spectrometer) for surface analysis which is based at the division of Physical Chemistry.
For XPS measurements, the sample is illuminated with X-rays. The electrons which are subsequently emitted from the surface are analyzed according to their kinetic energy and provide detailed qualitative and quantitative information about the elements present at the surface and for high resolution spectra also about the chemical state of these elements.
The setup is suitable for fast measurements with excellent S/N ratio as well as for high resolution measurements with FWHM down to 0.6 eV (eg. Ag 3d). The high S/N ratio is essential for the measurement of delicate samples in order to keep the X-ray dose low. In addition to XPS, several other experimental options are possible, eg. UPS and REELS.
System: ESCALAB 250 Xi (Thermo Fisher)
X-ray source: Al (monochr.) or Mg/Al
Min. FWHM: 0.58 eV (Ag 3d)
Min. spot size: 20 µm
Sample temperature: controlled 100-1000 K
Gas analysis with quadrupole MS
UPS-source for HeI and HeII
Ar sputter gun for Ar+ and Ar clusters
XPS-imaging (resolution 2 µm)
Electron source for REELS
Automatic charge compensation
Glovebox attached to vakuum system
Dr. Carsten Dosche