PD Dr. Izabella Brand
Lead Scientist AFM

+49 (0) 441 798 3973

+49 (0) 441 798 3979

Prof. Dr. Gunther Wittstock
Group Leader

+49 (0) 441 798 3970

+49 (0) 441 798 3979

Mailing Address

University of Oldenburg
School of Mathematics
   and Science
Institute of Chemistry
Wittstock Group
D-26111 Oldenburg


University of Oldenburg
Campus Wechloy
Carl-von-Ossietzky Street 9-11
Building W3, 1st floor
D-26129 Oldenburg

How to find us

AFM Facility

Electrochemistry and Condensed Matter Interfaces - Wittstock Group

The Institute of Chemistry runs an atomic force microscopy facility, which is located at the Division of Physical Chemistry.


The AFM can be used upon request by all groups of the university, according to the Terms of Use. If you are interested, please contact:
PD Dr. Izabella Brand, phone 0441-7983973, izabella.brand{at}

Instrumental Details

Controller: Nanoscope IIIA (Veeco), Quadrex Extension Box
Messköpfe: Dimension 3100, Enviroscope, Bioscope (alle Veeco)
Erweiterungen: Pulsed force mode (Witec), Letifähigkeitserweiterung (Veeco)
Spezialanwendungen: Arbeit in Lösung, Arbeit in kontrollierten Gasatmosphären, große Proben


Atomic force microscopy (AFM) or scanning force microscopy (SFM) uses a sharp tip as a sensor to measure forces between the sample and the tip. The tip is attached to a soft cantilever. The cantilever is bent when a force acts on the tip and this bending is quantified by the deflection of a laser beam reflected at the backside of the cantilever. The tip moves over the sample during which different forces act between sample and tip. The image data can be transformed to a false-color image for display. Different forces can be utilized for image generation which opens opportunities to image different materials properties.

Details to the modes of scanning force microscopy (Link)

(Changed: 20 Jun 2024)  | 
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