Scientific director

Technical Director

Dr. Vita Solovyeva




Ultrafast TEM Jeol

Ultrafast Transmission Electron Microscopy based on Jeol JEM-F200

Ultrafast Transmission Electron Microscope based on Jeol JEM F200 Field emission transmission electron microscope is currently being built in the group of Prof. Dr. Schäfer


Cold FEG  
Accelerating voltage  20 kV to 200kV
Magnification TEM 20 to 2x106
Magnification STEM 200 to 150x106
STEM unit including HAADF- detector
Max spaciment tilt angle +/-80°
Condencer system Quad Lens

TVIPS, TemCam-XF416 cooled CMOS, 63.5mm x 63.5mm

4096 x 4096 pixels

Camera readout time 25fps to 200fps
Additional oprions

Electron energy loss spectroscopy (EELS)

(Changed: 23 Jan 2023)  |