Ultrafast TEM Jeol
Ultrafast TEM Jeol
Ultrafast Transmission Electron Microscopy based on Jeol JEM-F200
Ultrafast Transmission Electron Microscope based on Jeol JEM F200 Field emission transmission electron microscope is currently being built in the group of Prof. Dr. Schäfer
Parameters:
Cold FEG | |
Accelerating voltage | 20 kV to 200kV |
Magnification TEM | 20 to 2x106 |
Magnification STEM | 200 to 150x106 |
STEM unit | including HAADF- detector |
Max spaciment tilt angle | +/-80° |
Condencer system | Quad Lens |
Camera | TVIPS, TemCam-XF416 cooled CMOS, 63.5mm x 63.5mm 4096 x 4096 pixels |
Camera readout time | 25fps to 200fps |
Additional oprions | Electron energy loss spectroscopy (EELS) |