AFM Facility
Contact
Mailing Address
Visitors
AFM Facility
Electrochemistry and Condensed Matter Interfaces - Wittstock Group
The Institute of Chemistry runs an atomic force microscopy facility, which is located at the Division of Physical Chemistry.
Access
The AFM can be used upon request by all groups of the university, according to the Terms of Use. If you are interested, please contact:
PD Dr. Izabella Brand, phone 0441-7983973, izabella.brand{at}uni-oldenburg.de
Instrumental Details
Controller: Nanoscope IIIA (Veeco), Quadrex Extension Box
Messköpfe: Dimension 3100, Enviroscope, Bioscope (alle Veeco)
Erweiterungen: Pulsed force mode (Witec), Letifähigkeitserweiterung (Veeco)
Spezialanwendungen: Arbeit in Lösung, Arbeit in kontrollierten Gasatmosphären, große Proben
Method
Atomic force microscopy (AFM) or scanning force microscopy (SFM) uses a sharp tip as a sensor to measure forces between the sample and the tip. The tip is attached to a soft cantilever. The cantilever is bent when a force acts on the tip and this bending is quantified by the deflection of a laser beam reflected at the backside of the cantilever. The tip moves over the sample during which different forces act between sample and tip. The image data can be transformed to a false-color image for display. Different forces can be utilized for image generation which opens opportunities to image different materials properties.
Details to the modes of scanning force microscopy (Link)