Photoemission electron microscopy (PEEM) differs somewhat from conventional microscopy techniques. In this case, the sample is also the electron source, in that electrons are triggered from it - by illumination with short laser pulses. If first a laser pulse is used for optical excitation and then a second one to interrogate the dynamics after a variable waiting period, the electrons carry valuable information about the charge carrier dynamics at the time of triggering after emission.
The trigger locations of the electrons are imaged in the microscope with high spatial resolution. At the same time, the time of flight of the electrons is recorded, so that their kinetic energy spectrum is also measured. This allows us to gain detailed insights into the charge carrier dynamics near the surface of a nanostructure after optical excitation.
We have recently commissioned our PEEM and are now offering various projects on different samples as final theses. Techniques used include sample preparation, nanopositioning systems, ultra-high vacuum, electron microscopy, time-of-flight electron spectroscopy and excitation-interrogation experiments with short laser pulses. Please contact us if you would like to do something at PEEM and we will tell you what particularly exciting samples are currently available. You can then prepare them yourself, investigate them in PEEM in a time-resolved manner and evaluate the data for your thesis. In the best case scenario, the result will be a first scientific publication.
