Modelling of Near-Field Thermal Microscopes

PD Dr. Svend-Age Biehs

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Institut für Physik  (» Postanschrift)

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Modelling of Near-Field Thermal Microscopes

With so-called near-field thermal imaging microscopes, such as the near-field scanning thermal microscope developed in Oldenburg (see Prof. Achim Kittel's group), heat currents in the near-field regime (i.e. distance smaller than the thermal wavelength) can be measured with nanometer resolution. Other microscopes based on scattering, such as the scattering noise microscope shown schematically in the image on the left (see Prof. Zhenghua An's group), scatter the thermal near field to a far-field detector. This enables non-contact measurement of local temperatures and local density of states with nanoscale resolution. We collaborate with experimental research groups to model and interpret the signals measured with such microscopes.

Selected Publications:

(Stand: 01.05.2025)  Kurz-URL:Shortlink: https://uol.de/p112701
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