CCD and CMOS sensors
In the field of optical metrology the use of high resolution CCD sensors with 1024×1024 to 2048×2048 pixels is predominant. Due to special features (e.g. random pixel access, characteristic curve) CMOS sensors with similar resolution can be an interesting alternative. We compare characteristics of both sensor types that are important for interferometry and demonstrate exemplary applications that are only possible by using CMOS cameras.
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- Helmers, H.; Schellenberg, M.: CMOS versus CCD sensors in speckle interferometry, Opt. Laser Technol. 35 (2003) 587-595
We take part in a working group of the European Machine Vision Association (EMVA) whose aim is to define a unified method to measure, compute and present specification parameters for cameras and image sensors used for machine vision applications.